About the Journal
Purpose and Scope
Information for Authors
Journal Special Sections
Past Issue Content Pages
1986 – 2000
a quarterly journal devoted to the use of the powder method for
materials characterization, is available on an annual subscription
basis. The journal’s focus is on materials characterization employing
X-ray powder diffraction techniques.
The journal features articles covering a wide range of applications,
from materials analysis to epitactic growth of thin films to advances in applications software.